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    Evolution of end-of-range defects in silicon-on-insulator substrates

    New search for: Fazzini, P. F.
    New search for: Cristiano, F.
    New search for: Dupre, C.
    New search for: Paul, S.
    New search for: Ernst, T.
    New search for: Kheyrandish, H.
    New search for: Bourdelle, K. K.
    New search for: Lerch, W.

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    Evolution of end-of-range defects in silicon-on-insulator substrates

    New search for: Fazzini, P. F.
    New search for: Cristiano, F.
    New search for: Dupre, C.
    New search for: Paul, S.
    New search for: Ernst, T.
    New search for: Kheyrandish, H.
    New search for: Bourdelle, K. K.
    New search for: Lerch, W.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Evolution of end-of-range defects in silicon-on-insulator substrates

    New search for: Fazzini, P. F.
    New search for: Cristiano, F.
    New search for: Dupre, C.
    New search for: Paul, S.
    New search for: Ernst, T.
    New search for: Kheyrandish, H.
    New search for: Bourdelle, K. K.
    New search for: Lerch, W.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
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    Document information
    Title:

    Evolution of end-of-range defects in silicon-on-insulator substrates

    Contributors:

    Fazzini, P. F. (author) / Cristiano, F. (author) / Dupre, C. (author) / Paul, S. (author) / Ernst, T. (author) / Kheyrandish, H. (author) / Bourdelle, K. K. (author) / Lerch, W. (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING B ADVANCED FUNCTIONAL SOLID STATE MATERIALS ; 154-155 ; 256-259

    Publication date:

    2008-01-01

    Size:

    4 pages

    ISSN:

    0921-5107

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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