Zone T Structural Characterization of Superhard TiB~2 Thin Films Prepared by RF Magnetron Sputtering: Fid-Bau Portal

Zone T Structural Characterization of Superhard TiB~2 Thin Films Prepared by RF Magnetron Sputtering

Dai, W. / Zhang, T.-j. / Yang, J.-y. / Sun, R.-x. / Xu, J.-l.

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Zone T Structural Characterization of Superhard TiB~2 Thin Films Prepared by RF Magnetron Sputtering

Dai, W. / Zhang, T.-j. / Yang, J.-y. / Sun, R.-x. / Xu, J.-l.

Zone T Structural Characterization of Superhard TiB~2 Thin Films Prepared by RF Magnetron Sputtering

Dai, W. / Zhang, T.-j. / Yang, J.-y. / Sun, R.-x. / Xu, J.-l.

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Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Zone T Structural Characterization of Superhard TiB~2 Thin Films Prepared by RF Magnetron Sputtering

Contributors:

Dai, W. (author) / Zhang, T.-j. (author) / Yang, J.-y. (author) / Sun, R.-x. (author) / Xu, J.-l. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING -HANGZHOU- ; 26 ; 697-699

Publication date:

2008-01-01

Size:

3 pages

ISSN:

1673-2812

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 620.11

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