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    Observation of Crystalline Defects Causing pn Junction Reverse Leakage Current

    New search for: Watanabe, T.
    New search for: Nakao, Y.
    New search for: Fujihira, K.
    New search for: Miura, N.
    New search for: Tarui, Y.
    New search for: Imaizumi, M.
    New search for: Oomori, T.

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    Observation of Crystalline Defects Causing pn Junction Reverse Leakage Current

    New search for: Watanabe, T.
    New search for: Nakao, Y.
    New search for: Fujihira, K.
    New search for: Miura, N.
    New search for: Tarui, Y.
    New search for: Imaizumi, M.
    New search for: Oomori, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Observation of Crystalline Defects Causing pn Junction Reverse Leakage Current

    New search for: Watanabe, T.
    New search for: Nakao, Y.
    New search for: Fujihira, K.
    New search for: Miura, N.
    New search for: Tarui, Y.
    New search for: Imaizumi, M.
    New search for: Oomori, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Observation of Crystalline Defects Causing pn Junction Reverse Leakage Current

    Contributors:

    Watanabe, T. (author) / Nakao, Y. (author) / Fujihira, K. (author) / Miura, N. (author) / Tarui, Y. (author) / Imaizumi, M. (author) / Oomori, T. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 600/603 ; 999-1002

    Publication date:

    2009-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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