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    Defects Study by Activation Energy Profile for Lowering Leakage Current in P-N Junction

    New search for: Srithanachai, I.
    New search for: Ueamanapong, S.
    New search for: Rujanapich, P.
    New search for: Atiwongsangthong, N.
    New search for: Niemcharoen, S.
    New search for: Poyai, A.
    New search for: Titiroongruang, W.

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    Defects Study by Activation Energy Profile for Lowering Leakage Current in P-N Junction

    New search for: Srithanachai, I.
    New search for: Ueamanapong, S.
    New search for: Rujanapich, P.
    New search for: Atiwongsangthong, N.
    New search for: Niemcharoen, S.
    New search for: Poyai, A.
    New search for: Titiroongruang, W.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Defects Study by Activation Energy Profile for Lowering Leakage Current in P-N Junction

    New search for: Srithanachai, I.
    New search for: Ueamanapong, S.
    New search for: Rujanapich, P.
    New search for: Atiwongsangthong, N.
    New search for: Niemcharoen, S.
    New search for: Poyai, A.
    New search for: Titiroongruang, W.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
    Title:

    Defects Study by Activation Energy Profile for Lowering Leakage Current in P-N Junction

    Contributors:

    Srithanachai, I. (author) / Ueamanapong, S. (author) / Rujanapich, P. (author) / Atiwongsangthong, N. (author) / Niemcharoen, S. (author) / Poyai, A. (author) / Titiroongruang, W. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 695 ; 569-572

    Publication date:

    2011-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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