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    Degradation of Charge Collection Efficiency for 6H-SiC Diodes by Electron Irradiation

    New search for: Iwamoto, N.
    New search for: Onoda, S.
    New search for: Hishiki, S.
    New search for: Ohshima, T.
    New search for: Murakami, M.
    New search for: Nakano, I.
    New search for: Kawano, K.

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    Degradation of Charge Collection Efficiency for 6H-SiC Diodes by Electron Irradiation

    New search for: Iwamoto, N.
    New search for: Onoda, S.
    New search for: Hishiki, S.
    New search for: Ohshima, T.
    New search for: Murakami, M.
    New search for: Nakano, I.
    New search for: Kawano, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Degradation of Charge Collection Efficiency for 6H-SiC Diodes by Electron Irradiation

    New search for: Iwamoto, N.
    New search for: Onoda, S.
    New search for: Hishiki, S.
    New search for: Ohshima, T.
    New search for: Murakami, M.
    New search for: Nakano, I.
    New search for: Kawano, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
    Title:

    Degradation of Charge Collection Efficiency for 6H-SiC Diodes by Electron Irradiation

    Contributors:

    Iwamoto, N. (author) / Onoda, S. (author) / Hishiki, S. (author) / Ohshima, T. (author) / Murakami, M. (author) / Nakano, I. (author) / Kawano, K. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 600/603 ; 1043-1046

    Publication date:

    2009-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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