Charge Collection Efficiency of 6H-SiC P^+N Diodes Degraded by Low-Energy Electron Irradiation: Fid-Bau Portal

Charge Collection Efficiency of 6H-SiC P^+N Diodes Degraded by Low-Energy Electron Irradiation

Iwamoto, N. / Onoda, S. / Ohshima, T. / Kojima, K. / Koizumi, A. / Uchida, K. / Nozaki, S.

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Charge Collection Efficiency of 6H-SiC P^+N Diodes Degraded by Low-Energy Electron Irradiation

Iwamoto, N. / Onoda, S. / Ohshima, T. / Kojima, K. / Koizumi, A. / Uchida, K. / Nozaki, S.

Charge Collection Efficiency of 6H-SiC P^+N Diodes Degraded by Low-Energy Electron Irradiation

Iwamoto, N. / Onoda, S. / Ohshima, T. / Kojima, K. / Koizumi, A. / Uchida, K. / Nozaki, S.

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Title:

Charge Collection Efficiency of 6H-SiC P^+N Diodes Degraded by Low-Energy Electron Irradiation

Contributors:

Iwamoto, N. (author) / Onoda, S. (author) / Ohshima, T. (author) / Kojima, K. (author) / Koizumi, A. (author) / Uchida, K. (author) / Nozaki, S. (author) / Bauer, A.J. / Friedrichs, P. / Krieger, M.

Published in:

Silicon Carbide and Related Materials 2009 ; 921-924

MATERIALS SCIENCE FORUM ; 645/648

Publication date:

2010-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

Iwamoto, N. / Onoda, S. / Hishiki, S. et al. | British Library Online Contents | 2009

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Iwamoto, N. / Koizumi, A. / Onoda, S. et al. | British Library Online Contents | 2012

Structural Defects in Electrically Degraded 4H-SiC PiN Diodes

Persson, P. O. A. / Jacobson, H. / Molina-Aldareguia, J. M. et al. | British Library Online Contents | 2002

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Ohshima, T. / Satoh, T. / Oikawa, M. et al. | British Library Online Contents | 2007

Charge Induced in 6H-SiC PN Diodes by Irradiation of Oxygen Ion Microbeams

Ohshima, T. / Satoh, T. / Oikawa, M. et al. | British Library Online Contents | 2006