Degradation of Charge Collection Efficiency Obtained for 6H-SiC n^+p Diodes Irradiated with Gold Ions: Fid-Bau Portal

Degradation of Charge Collection Efficiency Obtained for 6H-SiC n^+p Diodes Irradiated with Gold Ions

Ohshima, T. / Satoh, T. / Oikawa, M. / Onoda, S. / Hishiki, S. / Hirao, T. / Kamiya, T. / Yokoyama, T. / Sakamoto, A. / Tanaka, R.

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Degradation of Charge Collection Efficiency Obtained for 6H-SiC n^+p Diodes Irradiated with Gold Ions

Ohshima, T. / Satoh, T. / Oikawa, M. / Onoda, S. / Hishiki, S. / Hirao, T. / Kamiya, T. / Yokoyama, T. / Sakamoto, A. / Tanaka, R.

Degradation of Charge Collection Efficiency Obtained for 6H-SiC n^+p Diodes Irradiated with Gold Ions

Ohshima, T. / Satoh, T. / Oikawa, M. / Onoda, S. / Hishiki, S. / Hirao, T. / Kamiya, T. / Yokoyama, T. / Sakamoto, A. / Tanaka, R.

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Title:

Degradation of Charge Collection Efficiency Obtained for 6H-SiC n^+p Diodes Irradiated with Gold Ions

Contributors:

Ohshima, T. (author) / Satoh, T. (author) / Oikawa, M. (author) / Onoda, S. (author) / Hishiki, S. (author) / Hirao, T. (author) / Kamiya, T. (author) / Yokoyama, T. (author) / Sakamoto, A. (author) / Tanaka, R. (author)

Published in:

Silicon Carbide and Related Materials 2006 ; 913-916

MATERIALS SCIENCE FORUM ; 556/557

Publication date:

2007-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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