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Characterization of Dislocations and Micropipes in 4H n^+ SiC Substrates
Characterization of Dislocations and Micropipes in 4H n^+ SiC Substrates
Characterization of Dislocations and Micropipes in 4H n^+ SiC Substrates
Wu, P. (author) / Yoganathan, M. (author) / Zwieback, I. (author) / Chen, Y. (author) / Dudley, M. (author)
MATERIALS SCIENCE FORUM ; 600/603 ; 333-336
2009-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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