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Study of Compensation Defects and Electron Irradiation-Induced Defects in Undoped SI-InP by Positron Lifetime Spectroscopy
Study of Compensation Defects and Electron Irradiation-Induced Defects in Undoped SI-InP by Positron Lifetime Spectroscopy
Study of Compensation Defects and Electron Irradiation-Induced Defects in Undoped SI-InP by Positron Lifetime Spectroscopy
Zhang, Y.J. (author) / Deng, A.H. (author) / Zhao, Y.W. (author) / Yu, J. (author) / Yu, X.X. (author) / Cheng, X. (author) / Zhou, Y.L. (author) / Long, J.J. (author) / Wang, S.J. / Chen, Z.Q.
2009-01-01
3 pages
Article (Journal)
English
DDC:
620.11
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