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Electrically active defects in erbium-implanted silicon: Effects of annealing under high hydrostatic pressures and electron irradiation
Electrically active defects in erbium-implanted silicon: Effects of annealing under high hydrostatic pressures and electron irradiation
Electrically active defects in erbium-implanted silicon: Effects of annealing under high hydrostatic pressures and electron irradiation
Emtsev, V. V. (author) / Kozlovskii, V. V. (author) / Misiuk, A. (author) / Oganesyan, G. A. (author) / Poloskin, D. S. (author) / Sobolev, N. A. (author) / Tropp, E. A. (author)
MATERIALS SCIENCE AND ENGINEERING B ADVANCED FUNCTIONAL SOLID STATE MATERIALS ; 159-160 ; 157-159
2009-01-01
3 pages
Article (Journal)
English
DDC:
620.11
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