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    Evaluation of local strain in Si using UV-Raman spectroscopy

    New search for: Ogura, A.
    New search for: Kosemura, D.
    New search for: Takei, M.
    New search for: Uchida, H.
    New search for: Hattori, N.
    New search for: Yoshimaru, M.
    New search for: Mayuzumi, S.
    New search for: Wakabayashi, H.

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    Evaluation of local strain in Si using UV-Raman spectroscopy

    New search for: Ogura, A.
    New search for: Kosemura, D.
    New search for: Takei, M.
    New search for: Uchida, H.
    New search for: Hattori, N.
    New search for: Yoshimaru, M.
    New search for: Mayuzumi, S.
    New search for: Wakabayashi, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Evaluation of local strain in Si using UV-Raman spectroscopy

    New search for: Ogura, A.
    New search for: Kosemura, D.
    New search for: Takei, M.
    New search for: Uchida, H.
    New search for: Hattori, N.
    New search for: Yoshimaru, M.
    New search for: Mayuzumi, S.
    New search for: Wakabayashi, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Evaluation of local strain in Si using UV-Raman spectroscopy

    Contributors:

    Ogura, A. (author) / Kosemura, D. (author) / Takei, M. (author) / Uchida, H. (author) / Hattori, N. (author) / Yoshimaru, M. (author) / Mayuzumi, S. (author) / Wakabayashi, H. (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING B ADVANCED FUNCTIONAL SOLID STATE MATERIALS ; 159-160 ; 206-211

    Publication date:

    2009-01-01

    Size:

    6 pages

    ISSN:

    0921-5107

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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