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In Situ Observation of Polytype Switches during SiC PVT Bulk Growth by High Energy X-Ray Diffraction
In Situ Observation of Polytype Switches during SiC PVT Bulk Growth by High Energy X-Ray Diffraction
In Situ Observation of Polytype Switches during SiC PVT Bulk Growth by High Energy X-Ray Diffraction
Wellmann, P.J. (author) / Konias, K. (author) / Hens, P. (author) / Hock, R. (author) / Magerl, A. (author)
MATERIALS SCIENCE FORUM ; 615/617 ; 23-26
2009-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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