Observation of Lattice Plane Bending during SiC PVT Bulk Growth Using In Situ High Energy X-Ray Diffraction: Fid-Bau Portal

Observation of Lattice Plane Bending during SiC PVT Bulk Growth Using In Situ High Energy X-Ray Diffraction

Hock, R. / Konias, K. / Perdicaro, L. / Magerl, A. / Hens, P. / Wellmann, P.J.

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Observation of Lattice Plane Bending during SiC PVT Bulk Growth Using In Situ High Energy X-Ray Diffraction

Hock, R. / Konias, K. / Perdicaro, L. / Magerl, A. / Hens, P. / Wellmann, P.J.

Observation of Lattice Plane Bending during SiC PVT Bulk Growth Using In Situ High Energy X-Ray Diffraction

Hock, R. / Konias, K. / Perdicaro, L. / Magerl, A. / Hens, P. / Wellmann, P.J.

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Title:

Observation of Lattice Plane Bending during SiC PVT Bulk Growth Using In Situ High Energy X-Ray Diffraction

Contributors:

Hock, R. (author) / Konias, K. (author) / Perdicaro, L. (author) / Magerl, A. (author) / Hens, P. (author) / Wellmann, P.J. (author) / Bauer, A.J. / Friedrichs, P. / Krieger, M. / Pensl, G.

Published in:

Silicon Carbide and Related Materials 2009 ; 29-32

MATERIALS SCIENCE FORUM ; 645/648

Publication date:

2010-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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