Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
In Situ Observation of Polytype Switches during SiC PVT Bulk Growth by High Energy X-Ray Diffraction
In Situ Observation of Polytype Switches during SiC PVT Bulk Growth by High Energy X-Ray Diffraction
In Situ Observation of Polytype Switches during SiC PVT Bulk Growth by High Energy X-Ray Diffraction
Wellmann, P.J. (Autor:in) / Konias, K. (Autor:in) / Hens, P. (Autor:in) / Hock, R. (Autor:in) / Magerl, A. (Autor:in)
MATERIALS SCIENCE FORUM ; 615/617 ; 23-26
01.01.2009
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
TEM Observation of the Polytype Transformation of Bulk SiC Ingot
British Library Online Contents | 2009
|British Library Online Contents | 2010
|Occurrence of Polytype Transformation during Nitrogen Doping of SiC Bulk Wafer
British Library Online Contents | 2009
|British Library Online Contents | 2014
|Polytype AG verkauft Mehrheiten von Polytype Italia S.p.A
British Library Online Contents | 1998