Characterization of Screw Dislocations in a 4H-Silicon Carbide Diode Using X-Ray Microbeam Three-Dimensional Topography: Fid-Bau Portal

Characterization of Screw Dislocations in a 4H-Silicon Carbide Diode Using X-Ray Microbeam Three-Dimensional Topography

Tanuma, R. / Tamori, T. / Yonezawa, Y. / Yamaguchi, H. / Matsuhata, H. / Fukuda, K. / Arai, K.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Characterization of Screw Dislocations in a 4H-Silicon Carbide Diode Using X-Ray Microbeam Three-Dimensional Topography

Tanuma, R. / Tamori, T. / Yonezawa, Y. / Yamaguchi, H. / Matsuhata, H. / Fukuda, K. / Arai, K.

Characterization of Screw Dislocations in a 4H-Silicon Carbide Diode Using X-Ray Microbeam Three-Dimensional Topography

Tanuma, R. / Tamori, T. / Yonezawa, Y. / Yamaguchi, H. / Matsuhata, H. / Fukuda, K. / Arai, K.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Document information

Title:

Characterization of Screw Dislocations in a 4H-Silicon Carbide Diode Using X-Ray Microbeam Three-Dimensional Topography

Contributors:

Tanuma, R. (author) / Tamori, T. (author) / Yonezawa, Y. (author) / Yamaguchi, H. (author) / Matsuhata, H. (author) / Fukuda, K. (author) / Arai, K. (author)

Published in:

MATERIALS SCIENCE FORUM ; 615/617 ; 251-254

Publication date:

2009-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

Vetter, W. M. / Dudley, M. | British Library Online Contents | 2000

Partial dislocations in the X-ray topography of as-grown hexagonal silicon carbide crystals

Vetter, W. M. / Dudley, M. | British Library Online Contents | 2001

Studies of the Distribution of Elementary Threading Screw Dislocations in 4H Silicon Carbide Wafer

Chen, Y. / Zhang, N. / Huang, X.R. et al. | British Library Online Contents | 2009

Three-dimensional writing with ion microbeam

Takano, K. / Satoh, T. / Ishii, Y. et al. | British Library Conference Proceedings | 2009

Nucleation of c-Axis Screw Dislocations at Substrate Surface Damage during 4H-Silicon Carbide Homo-Epitaxy

Dudley, M. / Zhang, N. / Zhang, Y. et al. | British Library Online Contents | 2010