Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    The measurement of thermal conductivities using the photothermal deflection method for thin films with varying thickness

    New search for: Kim, H. J.
    New search for: Kim, J. H.
    New search for: Jeon, P. S.
    New search for: Yoo, J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    The measurement of thermal conductivities using the photothermal deflection method for thin films with varying thickness

    New search for: Kim, H. J.
    New search for: Kim, J. H.
    New search for: Jeon, P. S.
    New search for: Yoo, J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    The measurement of thermal conductivities using the photothermal deflection method for thin films with varying thickness

    New search for: Kim, H. J.
    New search for: Kim, J. H.
    New search for: Jeon, P. S.
    New search for: Yoo, J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    The measurement of thermal conductivities using the photothermal deflection method for thin films with varying thickness

    Contributors:

    Kim, H. J. (author) / Kim, J. H. (author) / Jeon, P. S. (author) / Yoo, J. (author)

    Published in:

    JOURNAL OF MECHANICAL SCIENCE AND TECHNOLOGY ; 23 ; 2514-2520

    Publication date:

    2009-01-01

    Size:

    7 pages

    ISSN:

    1738-494X

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Photothermal bending spectroscopy and photothermal deflection spectroscopy of C~6~0 thin films

    Gotoh, T. / Nonomura, S. / Hirata, S. et al. | British Library Online Contents | 1997

    Thermal diffusivity measurements of semiconducting amorphous GexSe100-x thin films by photothermal deflection technique

    Mathew, A. / Ravi, J. / Madhusoodanan, K. N. et al. | British Library Online Contents | 2004

    Absorption phenomena in organic thin films for solar cell applications investigated by photothermal deflection spectroscopy

    Goris, L. / Haenen, K. / Nesládek, M. et al. | British Library Online Contents | 2005

    Influences of vacancy defects on thermal conductivities of Ge thin films

    Zhang, X. / Sun, Z. | British Library Online Contents | 2011

    Thermal diffusivity of surface-microstructured silicon measured by photothermal deflection technique

    Chen, X. / Zhu, J. / Yin, G. et al. | British Library Online Contents | 2006

    Back to top