Thermal diffusivity measurements of semiconducting amorphous GexSe100-x thin films by photothermal deflection technique: Fid-Bau Portal

Thermal diffusivity measurements of semiconducting amorphous GexSe100-x thin films by photothermal deflection technique

Mathew, A. / Ravi, J. / Madhusoodanan, K. N. / Nair, K. P. / Rasheed, T. M.

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Thermal diffusivity measurements of semiconducting amorphous GexSe100-x thin films by photothermal deflection technique

Mathew, A. / Ravi, J. / Madhusoodanan, K. N. / Nair, K. P. / Rasheed, T. M.

Thermal diffusivity measurements of semiconducting amorphous GexSe100-x thin films by photothermal deflection technique

Mathew, A. / Ravi, J. / Madhusoodanan, K. N. / Nair, K. P. / Rasheed, T. M.

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Document information

Title:

Thermal diffusivity measurements of semiconducting amorphous GexSe100-x thin films by photothermal deflection technique

Contributors:

Mathew, A. (author) / Ravi, J. (author) / Madhusoodanan, K. N. (author) / Nair, K. P. (author) / Rasheed, T. M. (author)

Published in:

APPLIED SURFACE SCIENCE ; 227 ; 410-415

Publication date:

2004-01-01

Size:

6 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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