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    Thermal diffusivity of surface-microstructured silicon measured by photothermal deflection technique

    New search for: Chen, X.
    New search for: Zhu, J.
    New search for: Yin, G.
    New search for: Zhao, L.

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    Thermal diffusivity of surface-microstructured silicon measured by photothermal deflection technique

    New search for: Chen, X.
    New search for: Zhu, J.
    New search for: Yin, G.
    New search for: Zhao, L.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Thermal diffusivity of surface-microstructured silicon measured by photothermal deflection technique

    New search for: Chen, X.
    New search for: Zhu, J.
    New search for: Yin, G.
    New search for: Zhao, L.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Thermal diffusivity of surface-microstructured silicon measured by photothermal deflection technique

    Contributors:

    Chen, X. (author) / Zhu, J. (author) / Yin, G. (author) / Zhao, L. (author)

    Published in:

    MATERIALS LETTERS ; 60 ; 63-66

    Publication date:

    2006-01-01

    Size:

    4 pages

    ISSN:

    0167-577X

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.1105 / 530

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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