Atom-Probe Tomography of Semiconductor Materials and Device Structures: Fid-Bau Portal

Atom-Probe Tomography of Semiconductor Materials and Device Structures

Lauhon, L.J. / Adusumilli, P. / Ronsheim, P. / Flaitz, P.L. / Lawrence, D.

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Atom-Probe Tomography of Semiconductor Materials and Device Structures

Lauhon, L.J. / Adusumilli, P. / Ronsheim, P. / Flaitz, P.L. / Lawrence, D.

Atom-Probe Tomography of Semiconductor Materials and Device Structures

Lauhon, L.J. / Adusumilli, P. / Ronsheim, P. / Flaitz, P.L. / Lawrence, D.

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Check availability in my library

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Document information

Title:

Atom-Probe Tomography of Semiconductor Materials and Device Structures

Contributors:

Lauhon, L.J. (author) / Adusumilli, P. (author) / Ronsheim, P. (author) / Flaitz, P.L. (author) / Lawrence, D. (author)

Published in:

MRS BULLETIN- MATERIALS RESEARCH SOCIETY ; 34 ; 738-743

Publication date:

2009-01-01

Size:

6 pages

ISSN:

0883-7694

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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