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    Derivation of film characteristic constants of polycrystalline line for reliability evaluation against electromigration failure

    New search for: Hasegawa, M.
    New search for: Sasagawa, K.
    New search for: Uno, S.
    New search for: Saka, M.
    New search for: Abe, H.

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    Derivation of film characteristic constants of polycrystalline line for reliability evaluation against electromigration failure

    New search for: Hasegawa, M.
    New search for: Sasagawa, K.
    New search for: Uno, S.
    New search for: Saka, M.
    New search for: Abe, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Derivation of film characteristic constants of polycrystalline line for reliability evaluation against electromigration failure

    New search for: Hasegawa, M.
    New search for: Sasagawa, K.
    New search for: Uno, S.
    New search for: Saka, M.
    New search for: Abe, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Derivation of film characteristic constants of polycrystalline line for reliability evaluation against electromigration failure

    Contributors:

    Hasegawa, M. (author) / Sasagawa, K. (author) / Uno, S. (author) / Saka, M. (author) / Abe, H. (author)

    Published in:

    MECHANICS OF MATERIALS ; 41 ; 1090-1095

    Publication date:

    2009-01-01

    Size:

    6 pages

    ISSN:

    0167-6636

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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