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    Ellipsometry porosimetry (EP): Thin film porosimetry by coupling an adsorption setting with an optical measurement, highlights on diffusion results

    New search for: Bourgeois, A.
    New search for: Turcant, Y.
    New search for: Walsh, C.
    New search for: Defranoux, C.

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    Ellipsometry porosimetry (EP): Thin film porosimetry by coupling an adsorption setting with an optical measurement, highlights on diffusion results

    New search for: Bourgeois, A.
    New search for: Turcant, Y.
    New search for: Walsh, C.
    New search for: Defranoux, C.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Ellipsometry porosimetry (EP): Thin film porosimetry by coupling an adsorption setting with an optical measurement, highlights on diffusion results

    New search for: Bourgeois, A.
    New search for: Turcant, Y.
    New search for: Walsh, C.
    New search for: Defranoux, C.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
    Similar titles

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    Document information
    Title:

    Ellipsometry porosimetry (EP): Thin film porosimetry by coupling an adsorption setting with an optical measurement, highlights on diffusion results

    Contributors:

    Bourgeois, A. (author) / Turcant, Y. (author) / Walsh, C. (author) / Defranoux, C. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 256 ; S26-S29

    Publication date:

    2009-01-01

    Size:

    S26-S29

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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