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Distribution of dislocation source length and the size dependent yield strength in freestanding thin films

Shishvan, S. S. / Van der Giessen, E.

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Distribution of dislocation source length and the size dependent yield strength in freestanding thin films

Shishvan, S. S. / Van der Giessen, E.

Distribution of dislocation source length and the size dependent yield strength in freestanding thin films

Shishvan, S. S. / Van der Giessen, E.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Distribution of dislocation source length and the size dependent yield strength in freestanding thin films

Contributors:

Shishvan, S. S. (author) / Van der Giessen, E. (author)

Published in:

JOURNAL OF THE MECHANICS AND PHYSICS OF SOLIDS ; 58 ; 678-695

Publication date:

2010-01-01

Size:

18 pages

ISSN:

0022-5096

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 530 / 620

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