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    Effect of dislocation source length on yield strength of nanostructured metallic multilayer thin films

    New search for: Li, Q.

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    Effect of dislocation source length on yield strength of nanostructured metallic multilayer thin films

    New search for: Li, Q.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Effect of dislocation source length on yield strength of nanostructured metallic multilayer thin films

    New search for: Li, Q.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
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    Document information
    Title:

    Effect of dislocation source length on yield strength of nanostructured metallic multilayer thin films

    Contributors:

    Li, Q. (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING A ; 493 ; 288-291

    Publication date:

    2008-01-01

    Size:

    4 pages

    ISSN:

    0921-5093

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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