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Length scale dependent yield strength and fatigue behavior of nanocrystalline Cu thin films

Zhang, J. Y. / Zhang, X. / Liu, G. / Wang, R. H. / Zhang, G. J. / Sun, J.

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Length scale dependent yield strength and fatigue behavior of nanocrystalline Cu thin films

Zhang, J. Y. / Zhang, X. / Liu, G. / Wang, R. H. / Zhang, G. J. / Sun, J.

Length scale dependent yield strength and fatigue behavior of nanocrystalline Cu thin films

Zhang, J. Y. / Zhang, X. / Liu, G. / Wang, R. H. / Zhang, G. J. / Sun, J.

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Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Length scale dependent yield strength and fatigue behavior of nanocrystalline Cu thin films

Contributors:

Zhang, J. Y. (author) / Zhang, X. (author) / Liu, G. (author) / Wang, R. H. (author) / Zhang, G. J. (author) / Sun, J. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING A ; 528 ; 7774-7780

Publication date:

2011-01-01

Size:

7 pages

ISSN:

0921-5093

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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