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    Spectroscopic ellipsometry study of the dielectric response of Au In and Ag Sn thin-film couples

    New search for: Wronkowska, A. A.
    New search for: Wronkowski, A.
    New search for: Kukli@?ski, K.
    New search for: Senski, M.
    New search for: Skowro@?ski, .

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    Spectroscopic ellipsometry study of the dielectric response of Au In and Ag Sn thin-film couples

    New search for: Wronkowska, A. A.
    New search for: Wronkowski, A.
    New search for: Kukli@?ski, K.
    New search for: Senski, M.
    New search for: Skowro@?ski, .

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Spectroscopic ellipsometry study of the dielectric response of Au In and Ag Sn thin-film couples

    New search for: Wronkowska, A. A.
    New search for: Wronkowski, A.
    New search for: Kukli@?ski, K.
    New search for: Senski, M.
    New search for: Skowro@?ski, .

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Document information
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    Document information
    Title:

    Spectroscopic ellipsometry study of the dielectric response of Au In and Ag Sn thin-film couples

    Contributors:

    Wronkowska, A. A. (author) / Wronkowski, A. (author) / Kukli@?ski, K. (author) / Senski, M. (author) / Skowro@?ski, . (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 256 ; 4839-4844

    Publication date:

    2010-01-01

    Size:

    6 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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