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Spectroscopic ellipsometry study of the dielectric response of Au In and Ag Sn thin-film couples
Spectroscopic ellipsometry study of the dielectric response of Au In and Ag Sn thin-film couples
Spectroscopic ellipsometry study of the dielectric response of Au In and Ag Sn thin-film couples
Wronkowska, A. A. (Autor:in) / Wronkowski, A. (Autor:in) / Kukli@?ski, K. (Autor:in) / Senski, M. (Autor:in) / Skowro@?ski, . (Autor:in)
APPLIED SURFACE SCIENCE ; 256 ; 4839-4844
01.01.2010
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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