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    Extended Crystallographic Defects in Gallium Nitride

    New search for: Dasilva, Y.A.R.
    New search for: Ruterana, P.
    New search for: Lahourcade, L.
    New search for: Monroy, E.
    New search for: Nataf, G.
    New search for: Ponce, A.
    New search for: Bueno, D.

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    Extended Crystallographic Defects in Gallium Nitride

    New search for: Dasilva, Y.A.R.
    New search for: Ruterana, P.
    New search for: Lahourcade, L.
    New search for: Monroy, E.
    New search for: Nataf, G.
    New search for: Ponce, A.
    New search for: Bueno, D.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Extended Crystallographic Defects in Gallium Nitride

    New search for: Dasilva, Y.A.R.
    New search for: Ruterana, P.
    New search for: Lahourcade, L.
    New search for: Monroy, E.
    New search for: Nataf, G.
    New search for: Ponce, A.
    New search for: Bueno, D.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Extended Crystallographic Defects in Gallium Nitride

    Contributors:

    Dasilva, Y.A.R. (author) / Ruterana, P. (author) / Lahourcade, L. (author) / Monroy, E. (author) / Nataf, G. (author) / Ponce, A. / Bueno, D.

    Published in:

    Advanced Electron Microscopy and Nanomaterials Selected, peer reviewed papers from the First Joint Advanced Electron Microscopy School for Nanomaterials and the Workshop on Nanomaterials (AEM-NANOMAT'09), Saltillo (Coahuila) Mexico, September 29th-October 2nd, 2009 ; 117-122

    MATERIALS SCIENCE FORUM ; 644

    Publication date:

    2010-01-01

    Size:

    6 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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