CL/EBIC-SEM Techniques for Evaluation of Impact of Crystallographic Defects on Carrier Lifetime in 4H-SiC Epitaxial Layers: Fid-Bau Portal

Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

CL/EBIC-SEM Techniques for Evaluation of Impact of Crystallographic Defects on Carrier Lifetime in 4H-SiC Epitaxial Layers

Maximenko, S.I. / Freitas, J.A. / Picard, Y.N. / Klein, P.B. / Myers-Ward, R.L. / Lew, K.K. / Muzykov, P.G. / Gaskill, D.K. / Eddy, C.R. / Sudarshan, T.S.

Access

Check availability in my library

Order at Subito €

Page navigation

Document information

Export, share and cite

CL/EBIC-SEM Techniques for Evaluation of Impact of Crystallographic Defects on Carrier Lifetime in 4H-SiC Epitaxial Layers

Maximenko, S.I. / Freitas, J.A. / Picard, Y.N. / Klein, P.B. / Myers-Ward, R.L. / Lew, K.K. / Muzykov, P.G. / Gaskill, D.K. / Eddy, C.R. / Sudarshan, T.S.

CL/EBIC-SEM Techniques for Evaluation of Impact of Crystallographic Defects on Carrier Lifetime in 4H-SiC Epitaxial Layers

Maximenko, S.I. / Freitas, J.A. / Picard, Y.N. / Klein, P.B. / Myers-Ward, R.L. / Lew, K.K. / Muzykov, P.G. / Gaskill, D.K. / Eddy, C.R. / Sudarshan, T.S.

Access

Check availability in my library

Order at Subito €

Page navigation

Document information

Export, share and cite

Document information

Title:

CL/EBIC-SEM Techniques for Evaluation of Impact of Crystallographic Defects on Carrier Lifetime in 4H-SiC Epitaxial Layers

Contributors:

Maximenko, S.I. (author) / Freitas, J.A. (author) / Picard, Y.N. (author) / Klein, P.B. (author) / Myers-Ward, R.L. (author) / Lew, K.K. (author) / Muzykov, P.G. (author) / Gaskill, D.K. (author) / Eddy, C.R. (author) / Sudarshan, T.S. (author)

Published in:

Silicon Carbide and Related Materials 2009 ; 211-214

MATERIALS SCIENCE FORUM ; 645/648

Publication date:

2010-01-01

Size:

4 pages

ISSN:

Type of media:

Article (Journal)

Type of material:

Print

Language:

English

Classification:

© Metadata Copyright the British Library Board and other contributors. All rights reserved.

Similar titles

Identification of Defects Limiting the Carrier Lifetime in n^- Epitaxial Layers of 4H-SiC

Klein, P.B. | British Library Online Contents | 2010

Influence of Structural Defects on Carrier Lifetime in 4H Epitaxial Layers, Studied by High Resolution Optical Lifetime Mapping

Hassan, J. / Bergman, J.P. | British Library Online Contents | 2009

Conventional EBIC versus MOS/EBIC study of electrically active defects in Si and SOI

Bondarenko, I. / Kirk, H. / Kononchuk, O. et al. | British Library Online Contents | 1996

Simulation of recombination contrast of extended defects in the modulated EBIC

Sirotkin, V. V. / Yakimov, E. B. / Zaitsev, S. I. | British Library Online Contents | 1996

Defects in Thick Epitaxial Gaas Layers

Samic, H. / Bourgoin, J. C. | British Library Online Contents | 1997