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Time Sequential Evolutions of Optically-Induced Single Shockley Stacking Faults Formed in 4H-SiC Epitaxial Layers
Time Sequential Evolutions of Optically-Induced Single Shockley Stacking Faults Formed in 4H-SiC Epitaxial Layers
Time Sequential Evolutions of Optically-Induced Single Shockley Stacking Faults Formed in 4H-SiC Epitaxial Layers
Fujimoto, T. (author) / Aigo, T. (author) / Nakabayashi, M. (author) / Satoh, S. (author) / Katsuno, M. (author) / Tsuge, H. (author) / Yashiro, H. (author) / Hirano, H. (author) / Hoshino, T. (author) / Ohashi, W. (author)
2010-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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