Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Stacking Faults around the Hetero-Interface Induced by 6H-SiC Polytype Transformation on 3C-SiC with Solution Growth

    New search for: Seki, K.
    New search for: Morimoto, K.
    New search for: Ujihara, T.
    New search for: Tokunaga, T.
    New search for: Sasaki, K.
    New search for: Kuroda, K.
    New search for: Takeda, Y.
    New search for: Bauer, A.J.
    New search for: Friedrichs, P.
    New search for: Krieger, M.
    New search for: Pensl, G.
    New search for: Rupp, R.
    New search for: Seyller, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Stacking Faults around the Hetero-Interface Induced by 6H-SiC Polytype Transformation on 3C-SiC with Solution Growth

    New search for: Seki, K.
    New search for: Morimoto, K.
    New search for: Ujihara, T.
    New search for: Tokunaga, T.
    New search for: Sasaki, K.
    New search for: Kuroda, K.
    New search for: Takeda, Y.
    New search for: Bauer, A.J.
    New search for: Friedrichs, P.
    New search for: Krieger, M.
    New search for: Pensl, G.
    New search for: Rupp, R.
    New search for: Seyller, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Stacking Faults around the Hetero-Interface Induced by 6H-SiC Polytype Transformation on 3C-SiC with Solution Growth

    New search for: Seki, K.
    New search for: Morimoto, K.
    New search for: Ujihara, T.
    New search for: Tokunaga, T.
    New search for: Sasaki, K.
    New search for: Kuroda, K.
    New search for: Takeda, Y.
    New search for: Bauer, A.J.
    New search for: Friedrichs, P.
    New search for: Krieger, M.
    New search for: Pensl, G.
    New search for: Rupp, R.
    New search for: Seyller, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Stacking Faults around the Hetero-Interface Induced by 6H-SiC Polytype Transformation on 3C-SiC with Solution Growth

    Contributors:

    Seki, K. (author) / Morimoto, K. (author) / Ujihara, T. (author) / Tokunaga, T. (author) / Sasaki, K. (author) / Kuroda, K. (author) / Takeda, Y. (author) / Bauer, A.J. / Friedrichs, P. / Krieger, M.

    Published in:

    Silicon Carbide and Related Materials 2009 ; 363-366

    MATERIALS SCIENCE FORUM ; 645/648

    Publication date:

    2010-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Stacking faults at the boundary between 15R- and 4H-polytype in SiC

    Lin, S. / Chen, Z. / Ba, Y. et al. | British Library Online Contents | 2012

    SiC Polytype Transformation on the Growth Surface

    Mokhov, E. N. / Obyden, S. K. / Roenkov, A. D. et al. | British Library Online Contents | 2001

    Stacking Rearrangement on SiC Surfaces: A Possible Seed for Polytype Heterostructure Growth

    Starke, U. / Bernhardt, J. / Schardt, J. et al. | British Library Online Contents | 2000

    Stacking Faults and a Novel Structural Polytype in a Hydrogen-Storage (La~0~.~8Mg~0~.~2)Ni~3~.~5 Alloy with Block-Stacking Superstructures

    Ishikawa, R. / Abe, E. | British Library Online Contents | 2009

    Electronic Localization around Stacking Faults in Silicon Carbide

    Iwata, H. / Lindefelt, U. / Oberg, S. et al. | British Library Online Contents | 2002

    Back to top