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Stacking faults at the boundary between 15R- and 4H-polytype in SiC

Lin, S. / Chen, Z. / Ba, Y. / Yang, M. / Li, L.

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Stacking faults at the boundary between 15R- and 4H-polytype in SiC

Lin, S. / Chen, Z. / Ba, Y. / Yang, M. / Li, L.

Stacking faults at the boundary between 15R- and 4H-polytype in SiC

Lin, S. / Chen, Z. / Ba, Y. / Yang, M. / Li, L.

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Order at Subito €

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Document information

Title:

Stacking faults at the boundary between 15R- and 4H-polytype in SiC

Contributors:

Lin, S. (author) / Chen, Z. (author) / Ba, Y. (author) / Yang, M. (author) / Li, L. (author)

Published in:

MATERIALS LETTERS ; 81 ; 27-30

Publication date:

2012-01-01

Size:

4 pages

ISSN:

0167-577X

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.1105 / 530

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