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Electronic Localization around Stacking Faults in Silicon Carbide
Electronic Localization around Stacking Faults in Silicon Carbide
Electronic Localization around Stacking Faults in Silicon Carbide
Iwata, H. (author) / Lindefelt, U. (author) / Oberg, S. (author) / Briddon, P. R. (author)
MATERIALS SCIENCE FORUM ; 389/393 ; 529-532
2002-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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