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Microstructural Characterization of Epitaxial Cubic Silicon Carbide Using Transmission Electron Microscopy
Microstructural Characterization of Epitaxial Cubic Silicon Carbide Using Transmission Electron Microscopy
Microstructural Characterization of Epitaxial Cubic Silicon Carbide Using Transmission Electron Microscopy
Chayasombat, B. (author) / Kimata, Y. (author) / Kato, T. (author) / Tokunaga, T. (author) / Sasaki, K. (author) / Kuroda, K. (author) / Bauer, A.J. / Friedrichs, P. / Krieger, M. / Pensl, G.
2010-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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