A platform for research: civil engineering, architecture and urbanism
Infrared spectroscopy and transmission electron microscopy of polycrystalline silicon carbide
Infrared spectroscopy and transmission electron microscopy of polycrystalline silicon carbide
Infrared spectroscopy and transmission electron microscopy of polycrystalline silicon carbide
Dkaki, M. (author) / Calcagno, L. (author) / Makthari, A. M. (author) / Raineri, V. (author)
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 4 ; 201-204
2001-01-01
4 pages
Article (Journal)
English
DDC:
621.38152
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
British Library Online Contents | 2010
|British Library Online Contents | 2007
|Structural Analysis of Polycrystalline BiFeO~3 Films by Transmission Electron Microscopy
British Library Online Contents | 2007
|Method for preparing silicon carbide powder from polycrystalline silicon cutting wastes
European Patent Office | 2016
|