Uniformity of Epitaxial Graphene on On-Axis and Off-Axis SiC Probed by Raman Spectroscopy and Nanoscale Current Mapping: Fid-Bau Portal

Uniformity of Epitaxial Graphene on On-Axis and Off-Axis SiC Probed by Raman Spectroscopy and Nanoscale Current Mapping

Sonde, S. / Giannazzo, F. / Huntzinger, J.R. / Tiberj, A. / Syvajarvi, M. / Yakimova, R. / Raineri, V. / Camassel, J.

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Uniformity of Epitaxial Graphene on On-Axis and Off-Axis SiC Probed by Raman Spectroscopy and Nanoscale Current Mapping

Sonde, S. / Giannazzo, F. / Huntzinger, J.R. / Tiberj, A. / Syvajarvi, M. / Yakimova, R. / Raineri, V. / Camassel, J.

Uniformity of Epitaxial Graphene on On-Axis and Off-Axis SiC Probed by Raman Spectroscopy and Nanoscale Current Mapping

Sonde, S. / Giannazzo, F. / Huntzinger, J.R. / Tiberj, A. / Syvajarvi, M. / Yakimova, R. / Raineri, V. / Camassel, J.

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Title:

Uniformity of Epitaxial Graphene on On-Axis and Off-Axis SiC Probed by Raman Spectroscopy and Nanoscale Current Mapping

Contributors:

Sonde, S. (author) / Giannazzo, F. (author) / Huntzinger, J.R. (author) / Tiberj, A. (author) / Syvajarvi, M. (author) / Yakimova, R. (author) / Raineri, V. (author) / Camassel, J. (author) / Bauer, A.J. / Friedrichs, P.

Published in:

Silicon Carbide and Related Materials 2009 ; 607-610

MATERIALS SCIENCE FORUM ; 645/648

Publication date:

2010-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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