Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Uniformity and Morphology of 10 x 100mm 4^o Off-Axis 4H-SiC Epitaxial Layers and their Effect on Device Performance

    New search for: Das, H.
    New search for: Sunkari, S.
    New search for: Oldham, T.
    New search for: Rodgers, J.
    New search for: Casady, J.
    New search for: Lebedev, A.A.
    New search for: Davydov, S.Y.
    New search for: Ivanov, P.A.
    New search for: Levinshtein, M.E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Uniformity and Morphology of 10 x 100mm 4^o Off-Axis 4H-SiC Epitaxial Layers and their Effect on Device Performance

    New search for: Das, H.
    New search for: Sunkari, S.
    New search for: Oldham, T.
    New search for: Rodgers, J.
    New search for: Casady, J.
    New search for: Lebedev, A.A.
    New search for: Davydov, S.Y.
    New search for: Ivanov, P.A.
    New search for: Levinshtein, M.E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Uniformity and Morphology of 10 x 100mm 4^o Off-Axis 4H-SiC Epitaxial Layers and their Effect on Device Performance

    New search for: Das, H.
    New search for: Sunkari, S.
    New search for: Oldham, T.
    New search for: Rodgers, J.
    New search for: Casady, J.
    New search for: Lebedev, A.A.
    New search for: Davydov, S.Y.
    New search for: Ivanov, P.A.
    New search for: Levinshtein, M.E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Uniformity and Morphology of 10 x 100mm 4^o Off-Axis 4H-SiC Epitaxial Layers and their Effect on Device Performance

    Contributors:

    Das, H. (author) / Sunkari, S. (author) / Oldham, T. (author) / Rodgers, J. (author) / Casady, J. (author) / Lebedev, A.A. / Davydov, S.Y. / Ivanov, P.A. / Levinshtein, M.E.

    Published in:

    Silicon Carbide and Related Materials 2012 Selected, peer reviewed papers from the 9th European Conference on Silicon Carbide and Related Materials (ECSCRM 2012), September 2-6, 2012, St. Petersburg, Russian Federation ; 221-224

    MATERIALS SCIENCE FORUM ; 740/742

    Publication date:

    2013-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    High Uniformity with Reduced Surface Roughness of Chloride Based CVD Process on 100mm 4^o Off-Axis 4H-SiC

    Das, H. / Sunkari, S. / Oldham, T. et al. | British Library Online Contents | 2012

    Calculation of RQD using the >100mm vs. >2D Length Criterion

    Foley, J. / Milodragovich, E. | British Library Conference Proceedings | 2000

    High Quality 100mm 4H-SiC Substrates with Low Resistivity

    Straubinger, T.L. / Schmitt, E. / Storm, S. et al. | British Library Online Contents | 2010

    Growth of Crack-Free 100mm-Diameter 4H-SiC Crystals with Low Micropipe Densities

    Nakabayashi, M. / Fujimoto, T. / Katsuno, M. et al. | British Library Online Contents | 2009

    Steel section having a thickness of at least 100mm and method of manufacturing the same

    HOUYOUX CHRISTOPHE / RINALDI VALERIE / DONNAY BORIS et al. | European Patent Office | 2020

    Free access
    Back to top