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Influence of Processing and of Material Defects on the Electrical Characteristics of SiC-SBDs and SiC-MOSFETs
Influence of Processing and of Material Defects on the Electrical Characteristics of SiC-SBDs and SiC-MOSFETs
Influence of Processing and of Material Defects on the Electrical Characteristics of SiC-SBDs and SiC-MOSFETs
Fukuda, K. (author) / Kinoshita, A. (author) / Ohyanagi, T. (author) / Kosugi, R. (author) / Sakata, T. (author) / Sakuma, Y. (author) / Senzaki, J. (author) / Minami, A. (author) / Shimozato, A. (author) / Suzuki, T. (author)
2010-01-01
6 pages
Article (Journal)
English
DDC:
620.11
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