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    Reliability of Thin Thermally Grown SiO~2 on 3C-SiC Studied by Scanning Probe Microscopy

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    Reliability of Thin Thermally Grown SiO~2 on 3C-SiC Studied by Scanning Probe Microscopy

    New search for: Eriksson, J.
    New search for: Weng, M.H.
    New search for: Roccaforte, F.
    New search for: Giannazzo, F.
    New search for: Fiorenza, P.
    New search for: Lorenzzi, J.
    New search for: Ferro, G.
    New search for: Raineri, V.
    New search for: Bauer, A.J.
    New search for: Friedrichs, P.
    New search for: Krieger, M.
    New search for: Pensl, G.
    New search for: Rupp, R.
    New search for: Seyller, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Reliability of Thin Thermally Grown SiO~2 on 3C-SiC Studied by Scanning Probe Microscopy

    New search for: Eriksson, J.
    New search for: Weng, M.H.
    New search for: Roccaforte, F.
    New search for: Giannazzo, F.
    New search for: Fiorenza, P.
    New search for: Lorenzzi, J.
    New search for: Ferro, G.
    New search for: Raineri, V.
    New search for: Bauer, A.J.
    New search for: Friedrichs, P.
    New search for: Krieger, M.
    New search for: Pensl, G.
    New search for: Rupp, R.
    New search for: Seyller, T.

    Access

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    Access

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    Document information
    Title:

    Reliability of Thin Thermally Grown SiO~2 on 3C-SiC Studied by Scanning Probe Microscopy

    Contributors:

    Eriksson, J. (author) / Weng, M.H. (author) / Roccaforte, F. (author) / Giannazzo, F. (author) / Fiorenza, P. (author) / Lorenzzi, J. (author) / Ferro, G. (author) / Raineri, V. (author) / Bauer, A.J. / Friedrichs, P.

    Published in:

    Silicon Carbide and Related Materials 2009 ; 833-836

    MATERIALS SCIENCE FORUM ; 645/648

    Publication date:

    2010-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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