Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Surface defects in semiconductor lasers studied with cross-sectional scanning tunneling microscopy
Surface defects in semiconductor lasers studied with cross-sectional scanning tunneling microscopy
Surface defects in semiconductor lasers studied with cross-sectional scanning tunneling microscopy
Cobley, R. J. (Autor:in) / Teng, K. S. (Autor:in) / Brown, M. R. (Autor:in) / Rees, P. (Autor:in) / Wilks, S. P. (Autor:in)
APPLIED SURFACE SCIENCE ; 256 ; 5736-5739
01.01.2010
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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