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Mapping strain gradients in the FIB-structured InGaN/GaN multilayered films with 3D X-ray microbeam
Mapping strain gradients in the FIB-structured InGaN/GaN multilayered films with 3D X-ray microbeam
Mapping strain gradients in the FIB-structured InGaN/GaN multilayered films with 3D X-ray microbeam
Barabash, R. I. (author) / Gao, Y. F. (author) / Ice, G. E. (author) / Barabash, O. M. (author) / Chung, J. S. (author) / Liu, W. (author) / Kroger, R. (author) / Lohmeyer, H. (author) / Sebald, K. (author) / Gutowski, J. (author)
MATERIALS SCIENCE AND ENGINEERING A ; 528 ; 52-57
2010-01-01
6 pages
Article (Journal)
English
DDC:
620.11
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