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Trends in semiconductor defect engineering at the nanoscale

Seebauer, E. G. / Noh, K. W.

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Trends in semiconductor defect engineering at the nanoscale

Seebauer, E. G. / Noh, K. W.

Trends in semiconductor defect engineering at the nanoscale

Seebauer, E. G. / Noh, K. W.

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Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Trends in semiconductor defect engineering at the nanoscale

Contributors:

Seebauer, E. G. (author) / Noh, K. W. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING R REPORTS -LAUSANNE- ; 70 ; 151-168

Publication date:

2010-01-01

Size:

18 pages

ISSN:

0927-796X

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.1 / 530

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