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    Micro-Displacement Measurement with High Accuracy for Micro-Motion Stage Based on Computer Microvision

    New search for: Fan, Y.B.
    New search for: Lu, Q.H.
    New search for: Zhang, X.M.
    New search for: Zhao, B.
    New search for: Wang, G.
    New search for: Ma, W.
    New search for: Yang, Z.
    New search for: Yan, Y.

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    Micro-Displacement Measurement with High Accuracy for Micro-Motion Stage Based on Computer Microvision

    New search for: Fan, Y.B.
    New search for: Lu, Q.H.
    New search for: Zhang, X.M.
    New search for: Zhao, B.
    New search for: Wang, G.
    New search for: Ma, W.
    New search for: Yang, Z.
    New search for: Yan, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Micro-Displacement Measurement with High Accuracy for Micro-Motion Stage Based on Computer Microvision

    New search for: Fan, Y.B.
    New search for: Lu, Q.H.
    New search for: Zhang, X.M.
    New search for: Zhao, B.
    New search for: Wang, G.
    New search for: Ma, W.
    New search for: Yang, Z.
    New search for: Yan, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Micro-Displacement Measurement with High Accuracy for Micro-Motion Stage Based on Computer Microvision

    Contributors:

    Fan, Y.B. (author) / Lu, Q.H. (author) / Zhang, X.M. (author) / Zhao, B. / Wang, G. / Ma, W. / Yang, Z. / Yan, Y.

    Published in:

    Manufacturing Automation Technology Development ; 76-80

    KEY ENGINEERING MATERIALS ; 455

    Publication date:

    2011-01-01

    Size:

    5 pages

    ISSN:

    1013-9826

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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