Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Measuring substrate-independent modulus of thin films

    New search for: Hay, J.
    New search for: Crawford, B.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Measuring substrate-independent modulus of thin films

    New search for: Hay, J.
    New search for: Crawford, B.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Measuring substrate-independent modulus of thin films

    New search for: Hay, J.
    New search for: Crawford, B.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Measuring substrate-independent modulus of thin films

    Contributors:

    Hay, J. (author) / Crawford, B. (author)

    Published in:

    JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 26 ; 727-738

    Publication date:

    2011-01-01

    Size:

    12 pages

    ISSN:

    0884-2914

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Measuring substrate-independent modulus of dielectric films by instrumented indentation

    Hay, J. | British Library Online Contents | 2009

    Measuring the elastic modulus and residual stress of freestanding thin films using nanoindentation techniques

    Herbert, E.G. / Oliver, W.C. / de Boer, M.P. et al. | British Library Online Contents | 2009

    Nanostructured Gold Thin Films: Young Modulus Measurement

    Salvadori, M. C. / Vaz, A. R. / Melo, L. L. et al. | British Library Online Contents | 2003

    Elastic modulus measurement of multilayer metallic thin films

    Cho, K.-H. / Kim, Y. | British Library Online Contents | 1999

    Measuring thin dielectric films

    British Library Online Contents | 2002

    Back to top