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    A Comparative Study of the Morphologies of Etch Pits in Semi-Insulating Silicon Carbide Single Crystals

    New search for: Peng, Y.
    New search for: Xua, X.G.
    New search for: Hu, X.B.
    New search for: Chen, X.F.
    New search for: Gao, Y.Q.
    New search for: Monakhov, E.V.
    New search for: Hornos, T.
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    A Comparative Study of the Morphologies of Etch Pits in Semi-Insulating Silicon Carbide Single Crystals

    New search for: Peng, Y.
    New search for: Xua, X.G.
    New search for: Hu, X.B.
    New search for: Chen, X.F.
    New search for: Gao, Y.Q.
    New search for: Monakhov, E.V.
    New search for: Hornos, T.
    New search for: Svensson, B.G.

    Access

    Access via TIB
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    Order at Subito €

    A Comparative Study of the Morphologies of Etch Pits in Semi-Insulating Silicon Carbide Single Crystals

    New search for: Peng, Y.
    New search for: Xua, X.G.
    New search for: Hu, X.B.
    New search for: Chen, X.F.
    New search for: Gao, Y.Q.
    New search for: Monakhov, E.V.
    New search for: Hornos, T.
    New search for: Svensson, B.G.

    Access

    Access via TIB
    Check availability in my library
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    Document information
    Title:

    A Comparative Study of the Morphologies of Etch Pits in Semi-Insulating Silicon Carbide Single Crystals

    Contributors:

    Peng, Y. (author) / Xua, X.G. (author) / Hu, X.B. (author) / Chen, X.F. (author) / Gao, Y.Q. (author) / Monakhov, E.V. / Hornos, T. / Svensson, B.G.

    Published in:

    Silicon Carbide and Related Materials 2010 ; 145-152

    MATERIALS SCIENCE FORUM ; 679/680

    Publication date:

    2011-01-01

    Size:

    8 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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