Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    A correlation of TOF-SIMS and TXRF for the analysis of trace metal contamination on silicon and gallium arsenide

    New search for: Mowat, I.
    New search for: Lindley, P.
    New search for: McCaig, L.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    A correlation of TOF-SIMS and TXRF for the analysis of trace metal contamination on silicon and gallium arsenide

    New search for: Mowat, I.
    New search for: Lindley, P.
    New search for: McCaig, L.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    A correlation of TOF-SIMS and TXRF for the analysis of trace metal contamination on silicon and gallium arsenide

    New search for: Mowat, I.
    New search for: Lindley, P.
    New search for: McCaig, L.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    A correlation of TOF-SIMS and TXRF for the analysis of trace metal contamination on silicon and gallium arsenide

    Contributors:

    Mowat, I. (author) / Lindley, P. (author) / McCaig, L. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 203-204 ; 495-499

    Publication date:

    2003-01-01

    Size:

    5 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Quantification issues of trace metal contaminants on silicon wafers by means of TOF-SIMS, ICP-MS, and TXRF

    Rostam-Khani, P. / Hopstaken, M. J. P. / Vullings, P. et al. | British Library Online Contents | 2004

    A different approach in sample preparation method for metallic contamination study by ToF-SIMS and TXRF

    Ferlito, E. P. / Alnabulsi, S. / Mello, D. | British Library Online Contents | 2011

    Quantitative TOF-SIMS analysis of metal contamination on silicon wafers

    Zanderigo, F. / Ferrari, S. / Queirolo, G. et al. | British Library Online Contents | 2000

    A study of tunneling phenomena in gallium-arsenide-aluminum-gallium-arsenide heterostructures

    Lebens, John Andrew | TIBKAT | 1988

    Nucleation and growth of gallium arsenide on silicon (111)

    Alberts, V. / Neethling, J. H. / Vermaak, J. S. | British Library Online Contents | 1994

    Back to top