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Multiscale simulation of nanometric cutting of single crystal copper and its experimental validation
Multiscale simulation of nanometric cutting of single crystal copper and its experimental validation
Multiscale simulation of nanometric cutting of single crystal copper and its experimental validation
Pen, H. M. (author) / Liang, Y. C. (author) / Luo, X. C. (author) / Bai, Q. S. (author) / Goel, S. (author) / Ritchie, J. M. (author)
COMPUTATIONAL MATERIALS SCIENCE ; 50 ; 3431-3441
2011-01-01
11 pages
Article (Journal)
English
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