Inverted Pyramid Defects in 4H-SiC Epilayers

Shrivastava, A. / Muzykov, P.G. / Sudarshan, T.S. | British Library Online Contents | 2009

Analysis of Structural Defects in the 4H-SiC Epilayers and their Influence on the Electrical Properties

Izumi, S. / Kamata, I. / Tawara, T. et al. | British Library Online Contents | 2004

Structure of Carrot Defects in 4H-SiC Epilayers

Zhang, X. / Ha, S. / Benamara, M. et al. | British Library Online Contents | 2006

Electrical and Optical Properties of Highly Strained GaN Epilayers

Usikov, A. S. / Lundin, W. V. / Pushnyi, B. V. et al. | British Library Online Contents | 1998

Investigation of Photoluminescence Emission of Basal Plane Frank-Type Defects in 4H-SiC Epilayers

Kamata, I. / Zhang, X. / Tsuchida, H. | British Library Online Contents | 2011