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    Influence of Schottky Interfaces on Dielectric Properties in Perovskite-Type Oxide Thin-Film Capacitors

    New search for: Horiuchi, N.
    New search for: Hoshina, T.
    New search for: Takeda, H.
    New search for: Tsurumi, T.
    New search for: Shinozaki, K.
    New search for: Fujihara, S.
    New search for: Chazono, H.

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    Influence of Schottky Interfaces on Dielectric Properties in Perovskite-Type Oxide Thin-Film Capacitors

    New search for: Horiuchi, N.
    New search for: Hoshina, T.
    New search for: Takeda, H.
    New search for: Tsurumi, T.
    New search for: Shinozaki, K.
    New search for: Fujihara, S.
    New search for: Chazono, H.

    Access

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    Influence of Schottky Interfaces on Dielectric Properties in Perovskite-Type Oxide Thin-Film Capacitors

    New search for: Horiuchi, N.
    New search for: Hoshina, T.
    New search for: Takeda, H.
    New search for: Tsurumi, T.
    New search for: Shinozaki, K.
    New search for: Fujihara, S.
    New search for: Chazono, H.

    Access

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    Document information
    Title:

    Influence of Schottky Interfaces on Dielectric Properties in Perovskite-Type Oxide Thin-Film Capacitors

    Contributors:

    Horiuchi, N. (author) / Hoshina, T. (author) / Takeda, H. (author) / Tsurumi, T. (author) / Shinozaki, K. / Fujihara, S. / Chazono, H.

    Published in:

    Electroceramics in Japan XIV Selected, peer reviewed papers from the 30^t^h Electronics Division Meeting of the Ceramic Society of Japan, October 29-30, 2010, Tokyo, Japan ; 203-206

    KEY ENGINEERING MATERIALS ; 485

    Publication date:

    2011-01-01

    Size:

    4 pages

    ISSN:

    1013-9826

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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