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    Surface Wave Acoustic Microscopy for Rapid Non-destructive Evaluation of Silicon Nitride Balls

    New search for: Xiang, D.
    New search for: Qin, Y.
    New search for: Li, F.

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    Surface Wave Acoustic Microscopy for Rapid Non-destructive Evaluation of Silicon Nitride Balls

    New search for: Xiang, D.
    New search for: Qin, Y.
    New search for: Li, F.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Surface Wave Acoustic Microscopy for Rapid Non-destructive Evaluation of Silicon Nitride Balls

    New search for: Xiang, D.
    New search for: Qin, Y.
    New search for: Li, F.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Surface Wave Acoustic Microscopy for Rapid Non-destructive Evaluation of Silicon Nitride Balls

    Contributors:

    Xiang, D. (author) / Qin, Y. (author) / Li, F. (author)

    Published in:

    JOURNAL OF NONDESTRUCTIVE EVALUATION ; 30 ; 273-281

    Publication date:

    2011-01-01

    Size:

    9 pages

    ISSN:

    0195-9298

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.1127

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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