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    Nanoscale planar faulting in nanocrystalline Ni-W thin films: Grain growth, segregation, and residual stress

    New search for: Welzel, U.
    New search for: Kummel, J.
    New search for: Bischoff, E.
    New search for: Kurz, S.
    New search for: Mittemeijer, E.J.

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    Nanoscale planar faulting in nanocrystalline Ni-W thin films: Grain growth, segregation, and residual stress

    New search for: Welzel, U.
    New search for: Kummel, J.
    New search for: Bischoff, E.
    New search for: Kurz, S.
    New search for: Mittemeijer, E.J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Nanoscale planar faulting in nanocrystalline Ni-W thin films: Grain growth, segregation, and residual stress

    New search for: Welzel, U.
    New search for: Kummel, J.
    New search for: Bischoff, E.
    New search for: Kurz, S.
    New search for: Mittemeijer, E.J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Nanoscale planar faulting in nanocrystalline Ni-W thin films: Grain growth, segregation, and residual stress

    Contributors:

    Welzel, U. (author) / Kummel, J. (author) / Bischoff, E. (author) / Kurz, S. (author) / Mittemeijer, E.J. (author)

    Published in:

    JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 26 ; 2558-2573

    Publication date:

    2011-01-01

    Size:

    16 pages

    ISSN:

    0884-2914

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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